An Introduction to Mixed-Signal IC Test and Measurement


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Chapter 1: Overview of Mixed-Signal Testing | Engineering

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Test and Design-for-Test of Mixed-Signal Integrated Circuits

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Good: A book that has been read but is in good condition. Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Email Address. Sign In. Access provided by: anon Sign Out.


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It provides the reader with the theory of analog test, which is common in this kind of book, but also much information on the practical aspects of analog test, and, even more importantly, tells the reader the common mistakes to avoid. This practical focus puts this book above the vast majority of other texts. Within this context, an overview of existing test methods is given in this chapter, focusing on design-for-testability, built-in self-test and self-checking techniques suitable for the detection of realistic defects in analog and mixed-signal integrated circuits.

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An Introduction to Mixed-Signal IC Test and Measurement

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Bratt, A. Burns, M. Calvano, J. Carro, L, and Negreiros, M. Cassol, L. Caunegre, P. Chatterjee, A. Cota, E. Devarayanadurg, G.

An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement
An Introduction to Mixed-Signal IC Test and Measurement An Introduction to Mixed-Signal IC Test and Measurement

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